The sampling rate of 20 GSa/s eliminates signal distortion. With a long storage depth of up to 1 Gpts/ch, capture complete signal sequences for up to 50 millisec at max sampling rate without any gaps. Utilize search and navigate or history tools to analyze the entire stored trace. Each sample utilizes the 12-bit ADC, limiting the quantization error, which can help engineers to observe the details of the waveform clearly and measure the waveform accurately.

As the core of signal integrity analysis of high-speed systems, eye diagrams characterize high speed communication signals. The quality of the system can be evaluated by observing the influence of inter-symbol crosstalk, noise, and bandwidth. Jitter analysis characterizes the statistical distribution of small timing changes in a systems and is often used to debug digital communication systems and high-speed signal transmission. The SDS7000A series supports automatic parameter measurements for jitter and eye characterization. Easy setup and automatic measurements speed debugging and simplify engineering design testing.

The SAP5000D is our highest performing active differential probe kit providing up to 5 GHz of bandwidth and low noise for detailed signal analysis. Its high input resistance and low input capacitance can ensure that the load introduced by the measurement system is minimized. SAP5000D active probe utilizes the SAPBus interface, making it suitable for oscilloscopes including the SDS5000X, SDS6000A and SDS7000A series. These probes do not need an additional external power supply and are automatically recognized by the oscilloscope.